Nakano, Kazuhiko, and Kouichi Tsuji. "Nondestructive Elemental Depth Profiling of Japanese Lacquerware "Tamamushi-nuri" by Confocal 3D XRF Analysis in Comparison with Micro GEXRF." X-Ray Spectrometry 38/5 (2009): 446-450.
Nakano, Kazuhiko, and Kouichi Tsuji. "Nondestructive Elemental Depth Profiling of Japanese Lacquerware "Tamamushi-nuri" by Confocal 3D XRF Analysis in Comparison with Micro GEXRF." X-Ray Spectrometry 38/5 (2009): 446-450.
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2000075661
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2013-06-25T17:22:14
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title
Nakano, Kazuhiko, and Kouichi ...... trometry 38/5 (2009): 446-450.
shortTitle
Nakano and Tsuji, Nondestructi ...... XRF, X-Ray Spectrometry (2009)