New trends in ion beam processing of materials and beam induced nanometric phenomena : proceedings of symposium I on new trends in ion beam processing of materials and proceedings of symposium K on nanometric phenomena induced by laser, ion and cluster beams of the 1996 E-MRS spring conference, Strasbourg, France, June 4-7, 1996 / [F. Priolo ... et al., ed.)Light emission from silicon : progress towards Si-based optoelectronics : proceedings of symposium B on light emission from silicon: progress towards Si-based optoelectronics of the E-MRS 1998 Spring conference, Strasbourg, France, June 16-19, 1998 / ed. by J. Linnros, F. Priolo, L. Canham