AC losses in prototype conductors for the NET toroidal field coils / Jacobus Anne EikelboomAC losses test on Nb3Sn strands / J.A. EikelboomSeparation of bulk and surface recombination rates in silicon wafers using a new microwave reflection technique / J.A. Eikelboom, C. Leguijt, A.R. BurgersDetermination of the irradiation dependent efficiency of multicrystalline SI PV modules on basis of IV curve fitting and its influence on the annual performance / A.H.M.E. Reinders, J.A. EikelboomThe hot string and the cool module : case study of fault detection in PV systems by means if IR photography / J.A. Eikelboom, N.J.C.M. van der Borg, M.J. JansenHet ECN PV privé project / J.A. Eikelboom, N.J.C.M. van der Borg
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Een nieuwe faciliteit voor het karakteriseren van zonnecellen / R.A. Steeman, J.A. Eikelboom, W.C. SinkeMicrowave detection of minority carriers in solar cell silicon wafers / J.A. Eikelboom ... [et al.]Absolute rendementsbepaling van zonnecellen bij ECN / J.A. Eikelboom ... [et al.]Microwave detection of minority carriers in solar cell silicon wafers / J.A. Eikelboom ... [et al.]Local carrier lifetime of non-passivated multi-crystalline silicon wafers measured by the MFCA method / A. Schönecker, J.A. Eikelboom, W.C. SinkeAnalytical monitoring of losses in PV systems / C.W.A. Baltus, J.A. Eikelboom, R.J.C. van ZolingenOptimizing metalization patterns for yearly yield / A.R. Burgers, J.A. EikelboomInspectie van PV-systemen met behulp van infrarood-fotografie / N.J.C.M. van der Borg, J.A. Eikelboom, E.B.M. Visser